By Tor A. Fjeldly
Chapter 1 Electronics Laboratory Experiments available through net (pages 1–47): T. A. Fjeldly and M. S. Shur
Chapter 2 MIT Microelectronics WebLab (pages 49–87): J. A. del Alamo, V. Chang, L. Brooks, C. McLean, J. Hardison, G. Mishuris and L. Hui
Chapter three Instrumentation on the net (pages 89–143): T. Zimmer, M. Billaud, D. Geoffroy, Y. Danto, J. Martinez, F. Gomez, I. Gonzalez, H. Effinger, W. Seifert and A. Wiegand
Chapter four Next?Generation Laboratory: resolution for distant Characterization of Analog built-in Circuits (pages 145–174): C. Wulff, T. A. S?thre, A. Skjelvan and T. Ytterdal
Chapter five distant Laboratory for electric Experiments (pages 175–219): I. Gustavsson
Chapter 6 distant Laboratory: Bringing scholars up on the subject of Semiconductor units (pages 221–234): A. Soderlund, F. Ingvarson, P. Lundgren and ok. Jeppson
Read Online or Download Lab on the Web: Running Real Electronics Experiments via the Internet PDF
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Additional info for Lab on the Web: Running Real Electronics Experiments via the Internet
We have established two physical laboratory sites, AIM-Lab at RPI in the United States and LAB-on-WEB at UniK/NTNU in Norway. Both sites provide experiments on semiconductor devices that are accessible to clients worldwide. The AIM-Lab site at RPI is based on a TCP/IP communication solution that uses a Java applet on the client side. This is achieved by means of a Java virtual machine in the web browser that can download and execute Java code. LAB-on-WEB at UniK/NTNU presently o¤ers several di¤erent system solutions based on modern web and instrument control technologies, such as COMþ and LabVIEW 6i, and the advanced functionalities of today’s web browsers.
LAB-ON-WEB AT UNIK 19 is called from an HTML form in the active client page (see below) via an ASP, initiating the transfer of speciﬁcations on the desired measurement series to be performed. Subsequently, the instrument receives the necessary commands to perform the measurements. When the series is completed, the ASP receives the measurement results from the component and relays them to the client in XML format. The presentation of the results in the client browser can, for example, be in the form of an SVG plot along with a table of the raw data.
Fjeldly and Michael S. Shur ISBN 0-471-41375-5 Copyright 6 2003 John Wiley & Sons, Inc. 49 50 MIT MICROELECTRONICS WEBLAB electronic devices consists of a semiconductor parameter analyzer (such as an Agilent 4155B) to which the device under test, such as a transistor or diode, is connected. A semiconductor parameter analyzer is a costly state-of-the-art tool that is widely used by device engineers in industry. In addition to its cost, the complexity of this tool represents a signiﬁcant barrier to its deployment in a class.