By Vladislav A. Vashchenko, Andrei Shibkov
This e-book and Simulation software program package venture pricey Reader, this booklet venture brings to you a special examine device for ESD safeguard ideas utilized in analog-integrated circuit (IC) layout. Quick-start studying is mixed with in-depth knowing for the entire spectrum of cro- disciplinary wisdom required to excel within the ESD ?eld. The chapters conceal technical fabric from effortless semiconductor constitution and equipment degrees as much as complicated analog circuit layout examples and case experiences. The e-book venture presents assorted strategies for studying the fabric. the published fabric might be studied as any typical technical textbook. while, an alternative choice provides parallel workout utilizing the trial model of a complementary advertisement simulation device with ready simulation examples. blend of the textbook fabric with numerical simulation event provides a distinct chance to realize a degree of craftsmanship that's demanding to accomplish in a different way. The e-book is bundled with simpli?ed trial model of business combined- TM mode simulation software program from Angstrom layout Automation. The DECIMM (Device Circuit Mixed-Mode) simulator software and complementary to the ebook s- ulation examples should be downloaded from www.analogesd.com. The simulation examples ready through the authors aid the speci?c examples mentioned around the e-book chapters. A key notion in the back of this undertaking is to supply a chance not to in simple terms learn the booklet fabric but in addition achieve a far deeper figuring out of the topic by means of direct event via functional simulation examples
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Additional resources for ESD design for analog circuits
The result of this distribution is the increase of the electric field near the junctions and decrease in the middle of the structure due to space charge mutual neutralization. The negative differential resistance of the p–i–n structure is easy to prove using the analytical approach; the p–i–n diode I–V characteristic can be determined by the following equations. The electric field in the i-region at I = δI = 0 is given by E = EBR + δE (x, δI) . 10) 1, the changing electric W g (E) dx = const. 11), expanding g(E) and limiting by the first three terms W W δU = 0 1 g BR δEdx = − 2 g BR (δE)2 dx.
In the SCN diode ρ = 0, the electric field is distributed uniformly: E = U L ≈ const, I–V characteristic has a saturation region at I = I0 . In the SCL diode ρ < 0, the electric field is increased linearly in the anode contact direction: EMAX = E (0) = 2U L. Near the cathode contact, E (L) ≈ 0 and the electron injection in the n-region is rather limited. Since both the doping concentration and the length of the diode play a major role, a relative boundary between the SCN and SCL diodes for Si devices is ND L = 6 × 6 × 1011 cm–2 the diode is SCL; at ND L 6 × 1011 1011 cm–2 .
Since both the doping concentration and the length of the diode play a major role, a relative boundary between the SCN and SCL diodes for Si devices is ND L = 6 × 6 × 1011 cm–2 the diode is SCL; at ND L 6 × 1011 1011 cm–2 . At ND L –2 cm the diode is SCN. However, this statement is true with the assumption that the diffusion length of major carriers is bigger than the device length L, LD ∼ L. At a small diffusion length or a long n-region, for example, due to a high recombination rate, the SCL case is dominant.